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System
Features
Handles up
to 150 mm wafers
Remote keyboard
and trackball
Graphical
user interface
Sort programmable
software for building custom sorting
programs
Designed for
CLASS I ultraclean environment
Optical Cassette
Scanning for wafer presence and cross
slot detection
Non-contact
notch/flat finding and centering technology
CIP (cassette
in place) indicators to detect proper
cassette placement
Floppy disk
drive input/output
Extra wafer
slots for 50 wafer lot sorting
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