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System Features
Small footprint
36" x 28"
Class 1 clean
room compatible
GUI-driven
touchscreen display
High throughput
up to 800 wafers per hour
Flexible
handles 125, 150, or 200 mm diameter
wafers
CIP (cassette
in place) indicators to detect proper
cassette placement and correct wafer
size selection
Optical cassette
scanning for wafer presence and cross-slot
detection
IOC wafer
edge detection for safe handling
Non-contact
notch/flat finding and centering technology
Floppy disk
drive input/output
Dual OCR read
stations maximize wafer throughput
Custom sort
programmability software
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